The state of Maryland is seeking information from vendors regarding X-ray tomography simulation software intended for semiconductor failure analysis applications. The required software should be capable of generating simulated datasets using a variety of scanning trajectories and acquisition parameters, thereby allowing comparison and validation against physical datasets.

A strong preference will be given to software that can accurately simulate synchrotron setups. The solution must support simulation of X-ray energies ranging from 1 keV up to at least 450 keV. Simulation parameters should include source spectrum factors such as electron beam energy, anode material, thickness and angle, window material and thickness, as well as pre-filter configurations. It must also support diverse scanning trajectories, including circular, laminographic, and user-defined/custom options. This capability is considered essential for enhancing the efficiency and productivity of the semiconductor failure analysis process. The anticipated contract period for this engagement is one year.